スペーサー
equipment
スペーサー
X-ray Fluorescence (Energy-dispersive)
Inductively coupled plasma atomic emission spectroscopy (ICP-AES)
Inductively coupled plasma mass spectrometry (ICP-MS)
Atomic Absorption Spectrometry (AAS)
Ultraviolet–visible spectroscopy (UC-VIS)
High-performance liquid chromatography (HPLC)
Gas chromatography (GC) Detectors: ECD, FID, TCD, PID
Gas chromatography–mass spectrometry (GC-MS)
Fourier transform infrared spectroscopy (FT-IR)
Particle size analyzer (Laser diffraction type)
Ion chromatography
X-Ray Diffraction (XRD)    
Scanning electron microscope (SEM)
Energy-dispersive X-ray spectroscopy (EDX)
Stereomicroscope
Digital microscope
Inverted metallographic microscope
Phase contrast microscope
Personal image analysis system
Controlled atmosphere glove box
Controlled atmosphere furnace
スペーサー
Equipment in the radiation controlled area